Interactive exhibit · Electron optics
A working transmission electron microscope. Every detector image is computed from the physics: an electron wave passing through a real arrangement of atoms. Click any label on the column for the instrument physics behind it.
What you are looking at
About this exhibit
What is computed, and how
The three specimens are real atomic structures: Au nanoparticles (FCC, [110]) on amorphous carbon; Si [110] against amorphous SiO₂; and a SrTiO₃ Σ5 (310) tilt boundary. Their projected potential is built atom by atom.
TEM and diffraction treat the specimen as a phase object, then apply the full objective-lens transfer function: defocus, Cs, aperture, and temporal and spatial coherence envelopes. STEM convolves the aberrated probe with a Zn scattering map. 4D-STEM computes a real convergent-beam pattern (probe × transmission function, then FFT) at each of 1,600 probe positions. EDS uses real line energies, a Fano-limited detector response and Kramers bremsstrahlung. EELS uses Drude plasmons with Poisson plural scattering and real edge onsets. The Ronchigram is |FFT(probe × amorphous film)|² with the full axial aberration function. CBED/LACBED use two-beam dynamical theory per reflection with 3D structure factors and exact HOLZ geometry.
Simplifications: thick-crystal dynamical scattering (channelling) is approximated by a saturating phase rather than full multislice, and cross-sections are schematic. Trends and length scales are right; absolute intensities are illustrative.